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A Globally Covergent Gummel Map for Optimal Dopant Profiling

Math. Models Meth. Appl. Sci. - 2008
Download the publication : globalgummel.pdf [203Ko]  
We study a generalized Gummel iteration for the solution of an abstract optimal semi- conductor design problem, which covers a wide range of semiconductor models. The algorithm is exploiting the special structure of the KKT system and can be interpreted as a descent algorithm for an appropriately defined cost functional. This allows for a convergence proof which does not need the assumption of small biasing voltages. The al- gorithm is explicitly stated for the (quantum) drift diffusion model, the energy transport model and the microscopic Schr¨odinger-Poisson model.

BibTex references

@Article{BP08a,
  author       = {Burger, M. and Pinnau, R.},
  title        = {A Globally Covergent Gummel Map for Optimal Dopant Profiling},
  journal      = {Math. Models Meth. Appl. Sci.},
  year         = {2008},
  note         = {to appear},
  url          = \{/2008/BP08a},
}

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