A Globally Covergent Gummel Map for Optimal Dopant Profiling
We study a generalized Gummel iteration for the solution of an abstract optimal semi-
conductor design problem, which covers a wide range of semiconductor models. The
algorithm is exploiting the special structure of the KKT system and can be interpreted
as a descent algorithm for an appropriately defined cost functional. This allows for a
convergence proof which does not need the assumption of small biasing voltages. The al-
gorithm is explicitly stated for the (quantum) drift diffusion model, the energy transport
model and the microscopic Schr¨odinger-Poisson model.
BibTex references
@Article{BP08a,
author = {Burger, M. and Pinnau, R.},
title = {A Globally Covergent Gummel Map for Optimal Dopant Profiling},
journal = {Math. Models Meth. Appl. Sci.},
year = {2008},
note = {to appear},
url = \{/2008/BP08a},
}


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